Information card for entry 2234597
| Chemical name |
Di-μ-bromido-bis{[<i>N</i>,<i>N</i>-dimethyl-<i>N</i>'-(thiophen-2- ylmethylidene)ethane-1,2-diamine]copper(I)]} |
| Formula |
C18 H28 Br2 Cu2 N4 S2 |
| Calculated formula |
C18 H28 Br2 Cu2 N4 S2 |
| Title of publication |
Di-μ-bromido-bis{[<i>N</i>,<i>N</i>-dimethyl-<i>N</i>'-(thiophen-2-ylmethylidene)ethane-1,2-diamine]copper(I)]} |
| Authors of publication |
Goh, Christopher; Remillard, Zachary D.; Martinez, Andre P.; Keeley, Amanda C.; Jasinski, Jerry P. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
5 |
| Pages of publication |
m691 - m692 |
| a |
10.2029 ± 0.0003 Å |
| b |
15.4175 ± 0.0003 Å |
| c |
8.04875 ± 0.00019 Å |
| α |
90° |
| β |
108.628 ± 0.003° |
| γ |
90° |
| Cell volume |
1199.77 ± 0.06 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0555 |
| Residual factor for significantly intense reflections |
0.0363 |
| Weighted residual factors for significantly intense reflections |
0.0702 |
| Weighted residual factors for all reflections included in the refinement |
0.0783 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.047 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2234597.html