Information card for entry 2234601
| Chemical name |
1,1,2,2-Tetrakis(dimethylamino)ethane-1,2-diium bis(tetraphenylborate) acetone disolvate |
| Formula |
C64 H76 B2 N4 O2 |
| Calculated formula |
C64 H76 B2 N4 O2 |
| SMILES |
C(C(=[N+](C)C)N(C)C)(=[N+](C)C)N(C)C.[B-](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.[B-](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.O=C(C)C.O=C(C)C |
| Title of publication |
1,1,2,2-Tetrakis(dimethylamino)ethane-1,2-diium bis(tetraphenylborate) acetone disolvate |
| Authors of publication |
Tiritiris, Ioannis; Kantlehner, Willi |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
5 |
| Pages of publication |
o1371 |
| a |
30.0601 ± 0.0009 Å |
| b |
9.9321 ± 0.0003 Å |
| c |
18.2054 ± 0.0006 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
5435.4 ± 0.3 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
29 |
| Hermann-Mauguin space group symbol |
P c a 21 |
| Hall space group symbol |
P 2c -2ac |
| Residual factor for all reflections |
0.0646 |
| Residual factor for significantly intense reflections |
0.0455 |
| Weighted residual factors for significantly intense reflections |
0.1 |
| Weighted residual factors for all reflections included in the refinement |
0.1088 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.054 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2234601.html