Information card for entry 2234624
| Chemical name |
3-Ethyl-4-[(<i>E</i>)-(4-fluorobenzylidene)amino]-1<i>H</i>-1,2,4-triazole- 5(4<i>H</i>)-thione |
| Formula |
C11 H11 F N4 S |
| Calculated formula |
C11 H11 F N4 S |
| SMILES |
S=C1NN=C(N1/N=C/c1ccc(F)cc1)CC |
| Title of publication |
3-Ethyl-4-[(<i>E</i>)-(4-fluorobenzylidene)amino]-1<i>H</i>-1,2,4-triazole-5(4<i>H</i>)-thione |
| Authors of publication |
Jeyaseelan, S.; Devarajegowda, H. C.; Sathishkumar, R.; D'souza, Agnes Sylvia; D'souza, Alphonsus |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
5 |
| Pages of publication |
o1407 |
| a |
7.7967 ± 0.0017 Å |
| b |
8.4205 ± 0.0019 Å |
| c |
19.138 ± 0.004 Å |
| α |
90° |
| β |
99.78 ± 0.004° |
| γ |
90° |
| Cell volume |
1238.2 ± 0.5 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0697 |
| Residual factor for significantly intense reflections |
0.0453 |
| Weighted residual factors for significantly intense reflections |
0.1046 |
| Weighted residual factors for all reflections included in the refinement |
0.1148 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.021 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2234624.html