Information card for entry 2235057
| Chemical name |
2,2'-[(<i>E</i>,<i>E</i>)-<i>cis</i>-(Cyclohexane-1,4- diyl)bis(nitrilomethanylylidene)]diphenol |
| Formula |
C20 H22 N2 O2 |
| Calculated formula |
C20 H22 N2 O2 |
| SMILES |
Oc1ccccc1/C=N/[C@@H]1CC[C@H](CC1)/N=C\c1ccccc1O |
| Title of publication |
2,2'-[(<i>E</i>,<i>E</i>)-<i>cis</i>-(Cyclohexane-1,4-diyl)bis(nitrilomethanylylidene)]diphenol |
| Authors of publication |
Mohamed, Shaaban K.; Akkurt, Mehmet; Tahir, Muhammad N.; Abdelhamid, Antar A. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
6 |
| Pages of publication |
o1905 |
| a |
16.2979 ± 0.0011 Å |
| b |
6.1103 ± 0.0004 Å |
| c |
18.2336 ± 0.0012 Å |
| α |
90° |
| β |
104.975 ± 0.004° |
| γ |
90° |
| Cell volume |
1754.1 ± 0.2 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.1319 |
| Residual factor for significantly intense reflections |
0.05 |
| Weighted residual factors for significantly intense reflections |
0.1075 |
| Weighted residual factors for all reflections included in the refinement |
0.1399 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.011 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2235057.html