Information card for entry 2235482
| Chemical name |
(4a<i>R</i>*,8a<i>S</i>*)-2,3-Diphenyl-4a,5,6,7,8,8a-hexahydroquinoxaline |
| Formula |
C20 H20 N2 |
| Calculated formula |
C20 H20 N2 |
| SMILES |
N1=C(C(=N[C@H]2[C@@H]1CCCC2)c1ccccc1)c1ccccc1 |
| Title of publication |
(4a<i>R</i>*,8a<i>S</i>*)-2,3-Diphenyl-4a,5,6,7,8,8a-hexahydroquinoxaline |
| Authors of publication |
Chen, W.; Tang, K.-S.; Fan, L.-Y. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
7 |
| Pages of publication |
o2212 |
| a |
6.3546 ± 0.0001 Å |
| b |
13.4894 ± 0.0002 Å |
| c |
19.1921 ± 0.0003 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
1645.14 ± 0.04 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
19 |
| Hermann-Mauguin space group symbol |
P 21 21 21 |
| Hall space group symbol |
P 2ac 2ab |
| Residual factor for all reflections |
0.0359 |
| Residual factor for significantly intense reflections |
0.0355 |
| Weighted residual factors for significantly intense reflections |
0.0986 |
| Weighted residual factors for all reflections included in the refinement |
0.0989 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.053 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2235482.html