Information card for entry 2235918

Structure parameters

• Chemical name: <i>cis</i>-Diiodido(<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-\ tetramethylethylenediamine-κ^2^<i>N</i>,<i>N</i>')palladium(II)
• Formula: C6 H16 I2 N2 Pd
• Calculated formula: C6 H16 I2 N2 Pd
• SMILES: C1[N](C)(C)[Pd](I)(I)[N](C1)(C)C
• Title of publication: <i>cis</i>-Diiodido(<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetramethylethylenediamine-κ^2^<i>N</i>,<i>N</i>')palladium(II)
• Authors of publication: Abellán-López, Antonio; Chicote-Olalla, María Teresa; Bautista-Cerezo, Delia
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2012
• Journal volume: 68
• Journal issue: 8
• Pages of publication: m1129
• a: 7.9266 ± 0.0004 Å
• b: 14.6911 ± 0.0007 Å
• c: 10.5309 ± 0.0005 Å
• α: 90°
• β: 107.262 ± 0.002°
• γ: 90°
• Cell volume: 1171.09 ± 0.1 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 5
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.024
• Residual factor for significantly intense reflections: 0.0232
• Weighted residual factors for significantly intense reflections: 0.0592
• Weighted residual factors for all reflections included in the refinement: 0.0597
• Goodness-of-fit parameter for all reflections included in the refinement: 1.135
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes