Information card for entry 2237435
| Chemical name |
(1<i>E</i>,4<i>E</i>)-1,5-Bis[2-(trifluoromethyl)phenyl]penta-1,4-dien-3-one |
| Formula |
C19 H12 F6 O |
| Calculated formula |
C19 H12 F6 O |
| SMILES |
c1ccc(c(c1)/C=C/C(=O)/C=C/c1c(cccc1)C(F)(F)F)C(F)(F)F |
| Title of publication |
(1<i>E</i>,4<i>E</i>)-1,5-Bis[2-(trifluoromethyl)phenyl]penta-1,4-dien-3-one |
| Authors of publication |
Park, Dong Ho; Ramkumar, V.; Parthiban, P. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2013 |
| Journal volume |
69 |
| Journal issue |
2 |
| Pages of publication |
o177 |
| a |
11.3123 ± 0.0012 Å |
| b |
4.7907 ± 0.0004 Å |
| c |
15.1697 ± 0.0016 Å |
| α |
90° |
| β |
101.834 ± 0.003° |
| γ |
90° |
| Cell volume |
804.63 ± 0.14 Å3 |
| Cell temperature |
298 ± 2 K |
| Ambient diffraction temperature |
298 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
7 |
| Hermann-Mauguin space group symbol |
P 1 c 1 |
| Hall space group symbol |
P -2yc |
| Residual factor for all reflections |
0.0589 |
| Residual factor for significantly intense reflections |
0.0366 |
| Weighted residual factors for significantly intense reflections |
0.0821 |
| Weighted residual factors for all reflections included in the refinement |
0.0956 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.038 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2237435.html