Information card for entry 2238420
| Chemical name |
3,4-Dimethylthieno[2,3-<i>b</i>]thiophene-2,5-dicarbonitrile |
| Formula |
C10 H6 N2 S2 |
| Calculated formula |
C10 H6 N2 S2 |
| SMILES |
N#Cc1sc2c(c1C)c(c(s2)C#N)C |
| Title of publication |
3,4-Dimethylthieno[2,3-<i>b</i>]thiophene-2,5-dicarbonitrile |
| Authors of publication |
Mabkhot, Yahia Nasser; Al-Showiman, S. S.; Barakat, Assem; Choudhary, M. Iqbal; Yousuf, Sammer |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2013 |
| Journal volume |
69 |
| Journal issue |
8 |
| Pages of publication |
o1272 |
| a |
7.2573 ± 0.0011 Å |
| b |
10.1538 ± 0.0015 Å |
| c |
13.665 ± 0.002 Å |
| α |
94.467 ± 0.003° |
| β |
99.12 ± 0.004° |
| γ |
95.85 ± 0.004° |
| Cell volume |
984.5 ± 0.3 Å3 |
| Cell temperature |
273 ± 2 K |
| Ambient diffraction temperature |
273 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0987 |
| Residual factor for significantly intense reflections |
0.0554 |
| Weighted residual factors for significantly intense reflections |
0.1122 |
| Weighted residual factors for all reflections included in the refinement |
0.1315 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.985 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2238420.html