Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 2240155
Preview
| Coordinates | 2240155.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | 5,6-[(1<i>R</i>,10<i>S</i>)-2,9-Dioxatricyclo[8.6.0^3,8^.0^11,16^]hexadecane-1,10-diyl]-(C~60~‒I~h~)[5,6]fullerene methanedithione 0.1-solvate |
|---|---|
| Formula | C74.1 H10 O2 S0.21 |
| Calculated formula | C74.1033 H10 O2 S0.206 |
| Title of publication | Crystal structure of the 4~+~2 cycloadduct of photooxidized anthracene and C~60~ fullerene |
| Authors of publication | Bortel, Gábor; Kováts, Éva; Oszlányi, Gábor; Pekker, Sándor |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2014 |
| Journal volume | 70 |
| Journal issue | 11 |
| Pages of publication | 444 - 446 |
| a | 22.6657 ± 0.00013 Å |
| b | 22.6657 ± 0.00013 Å |
| c | 14.24938 ± 0.00011 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 7320.39 ± 0.08 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 4 |
| Space group number | 86 |
| Hermann-Mauguin space group symbol | P 42/n |
| Hall space group symbol | -P 4bc |
| Residual factor for all reflections | 0.05 |
| Residual factor for significantly intense reflections | 0.0454 |
| Weighted residual factors for significantly intense reflections | 0.1157 |
| Weighted residual factors for all reflections included in the refinement | 0.1199 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2240155.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.