Information card for entry 2241250
| Chemical name |
1,1,2,2-Tetramethyl-1,2-bis(2,3,4,5-tetramethylcyclopenta-2,4-dien-1-yl)disilane |
| Formula |
C22 H38 Si2 |
| Calculated formula |
C22 H38 Si2 |
| SMILES |
C1(C(=C(C(=C1C)C)C)C)[Si](C)(C)[Si](C)(C)C1C(=C(C(=C1C)C)C)C |
| Title of publication |
Crystal structure of 1,1,2,2-tetramethyl-1,2-bis(2,3,4,5-tetramethylcyclopenta-2,4-dien-1-yl)disilane |
| Authors of publication |
Godemann, Christian; Spannenberg, Anke; Beweries, Torsten |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2015 |
| Journal volume |
71 |
| Journal issue |
11 |
| Pages of publication |
o888 |
| a |
8.779 ± 0.0002 Å |
| b |
15.3039 ± 0.0004 Å |
| c |
16.4355 ± 0.0004 Å |
| α |
90° |
| β |
93.678 ± 0.001° |
| γ |
90° |
| Cell volume |
2203.61 ± 0.09 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0403 |
| Residual factor for significantly intense reflections |
0.0336 |
| Weighted residual factors for significantly intense reflections |
0.0905 |
| Weighted residual factors for all reflections included in the refinement |
0.0967 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.06 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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