Information card for entry 2241536
| Chemical name |
Chlorido(2,3-diphenyl-3,4,5,6-tetrahydro-2<i>H</i>-1,3-thiazin-4-one-κ<i>O</i>)triphenyltin |
| Formula |
C34 H30 Cl N O S Sn |
| Calculated formula |
C34 H30 Cl N O S Sn |
| SMILES |
C1(c2ccccc2)N(C(=[O][Sn](c2ccccc2)(c2ccccc2)(c2ccccc2)Cl)CCS1)c1ccccc1 |
| Title of publication |
Crystal structure of the 1:1 adduct of 2,3-diphenyl-3,4,5,6-tetrahydro-2<i>H</i>-1,3-thiazin-4-one with triphenyltin chloride |
| Authors of publication |
Yennawar, Hemant P.; Fox, Ryan; Silverberg, Lee J. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2016 |
| Journal volume |
72 |
| Journal issue |
3 |
| Pages of publication |
276 - 279 |
| a |
10.8454 ± 0.0019 Å |
| b |
9.5675 ± 0.0016 Å |
| c |
28.891 ± 0.005 Å |
| α |
90° |
| β |
92.886 ± 0.003° |
| γ |
90° |
| Cell volume |
2994 ± 0.9 Å3 |
| Cell temperature |
298 K |
| Ambient diffraction temperature |
298 K |
| Number of distinct elements |
7 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0557 |
| Residual factor for significantly intense reflections |
0.0479 |
| Weighted residual factors for significantly intense reflections |
0.1378 |
| Weighted residual factors for all reflections included in the refinement |
0.1435 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.076 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2241536.html