Information card for entry 2241889
| Chemical name |
(<i>E</i>)-[Diazene-1,2-diylbis(4,1-phenylene)]bis(dimethylsilanol) |
| Formula |
C16 H22 N2 O2 Si2 |
| Calculated formula |
C16 H22 N2 O2 Si2 |
| SMILES |
c1(ccc(cc1)[Si](O)(C)C)/N=N/c1ccc(cc1)[Si](O)(C)C |
| Title of publication |
Crystal structures of 3,3'-bis(hydroxydimethylsilanyl)azobenzene and 4,4'-bis(hydroxydimethylsilane)azobenzene |
| Authors of publication |
Strüben, Jan; Hoffmann, Jonas; Presa-Soto, David; Näther, Christian; Staubitz, Anne |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2016 |
| Journal volume |
72 |
| Journal issue |
11 |
| Pages of publication |
1590 - 1594 |
| a |
17.8705 ± 0.0004 Å |
| b |
10.0016 ± 0.0003 Å |
| c |
20.5323 ± 0.0005 Å |
| α |
90° |
| β |
97.013 ± 0.002° |
| γ |
90° |
| Cell volume |
3642.36 ± 0.16 Å3 |
| Cell temperature |
200 ± 2 K |
| Ambient diffraction temperature |
200 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0463 |
| Residual factor for significantly intense reflections |
0.0374 |
| Weighted residual factors for significantly intense reflections |
0.0917 |
| Weighted residual factors for all reflections included in the refinement |
0.0958 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.042 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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