Information card for entry 2242019
| Chemical name |
Ethyl 2-{[4-ethyl-5-(quinolin-8-yloxymethyl)-4<i>H</i>-1,2,4-triazol-3-yl]sulfanyl}acetate |
| Formula |
C18 H20 N4 O3 S |
| Calculated formula |
C18 H20 N4 O3 S |
| SMILES |
n1cccc2cccc(c12)OCc1n(c(nn1)SCC(=O)OCC)CC |
| Title of publication |
Crystal structure and Hirshfeld surface analysis of ethyl 2-{[4-ethyl-5-(quinolin-8-yloxymethyl)-4<i>H</i>-1,2,4-triazol-3-yl]sulfanyl}acetate |
| Authors of publication |
Bahoussi, Rawia Imane; Djafri, Ahmed; Chouaih, Abdelkader; Djafri, Ayada; Hamzaoui, Fodil |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2017 |
| Journal volume |
73 |
| Journal issue |
2 |
| Pages of publication |
173 - 176 |
| a |
4.088 ± 0.0003 Å |
| b |
21.2246 ± 0.0015 Å |
| c |
10.2037 ± 0.0007 Å |
| α |
90° |
| β |
99.407 ± 0.003° |
| γ |
90° |
| Cell volume |
873.43 ± 0.11 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
4 |
| Hermann-Mauguin space group symbol |
P 1 21 1 |
| Hall space group symbol |
P 2yb |
| Residual factor for all reflections |
0.044 |
| Residual factor for significantly intense reflections |
0.036 |
| Weighted residual factors for significantly intense reflections |
0.0903 |
| Weighted residual factors for all reflections included in the refinement |
0.0943 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.061 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2242019.html