Information card for entry 2242330
| Chemical name |
7-Methyl-5-[(4-methylbenzene)sulfonyl]-2<i>H</i>,5<i>H</i>-[1,3]dioxolo[4,5-<i>f</i>]indole |
| Formula |
C17 H15 N O4 S |
| Calculated formula |
C17 H15 N O4 S |
| SMILES |
C1Oc2c(cc3c(cn(c3c2)S(=O)(=O)c2ccc(cc2)C)C)O1 |
| Title of publication |
7-Methyl-5-[(4-methylbenzene)sulfonyl]-2<i>H</i>,5<i>H</i>-[1,3]dioxolo[4,5-<i>f</i>]indole: crystal structure and Hirshfeld analysis |
| Authors of publication |
Ali, Akbar; Zukerman-Schpector, Julio; Weber Paixão, Márcio; Jotani, Mukesh M.; Tiekink, Edward R. T. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2018 |
| Journal volume |
74 |
| Journal issue |
2 |
| Pages of publication |
184 - 188 |
| a |
15.2673 ± 0.0013 Å |
| b |
12.5337 ± 0.0009 Å |
| c |
17.6096 ± 0.0015 Å |
| α |
90° |
| β |
112.628 ± 0.003° |
| γ |
90° |
| Cell volume |
3110.3 ± 0.4 Å3 |
| Cell temperature |
290 ± 2 K |
| Ambient diffraction temperature |
290 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.0475 |
| Residual factor for significantly intense reflections |
0.0414 |
| Weighted residual factors for significantly intense reflections |
0.1192 |
| Weighted residual factors for all reflections included in the refinement |
0.1248 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.072 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2242330.html