Information card for entry 2242891
| Chemical name |
1,4-Dithiane 1,1,4,4-tetraoxide |
| Formula |
C4 H8 O4 S2 |
| Calculated formula |
C4 H8 O4 S2 |
| SMILES |
S1(=O)(=O)CCS(=O)(=O)CC1 |
| Title of publication |
Comparison of the C—H···O bonding in two crystalline phases of 1,4-dithiane 1,1,4,4-tetraoxide |
| Authors of publication |
Harlow, Richard L.; Oliver, Allen G.; Baker, Jonathan M.; Marshall, William J.; Sammes, Michael P. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2019 |
| Journal volume |
75 |
| Journal issue |
5 |
| Pages of publication |
576 - 579 |
| a |
7.1308 ± 0.0005 Å |
| b |
5.7245 ± 0.0004 Å |
| c |
8.376 ± 0.0006 Å |
| α |
90° |
| β |
91.138 ± 0.002° |
| γ |
90° |
| Cell volume |
341.84 ± 0.04 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150.15 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0325 |
| Residual factor for significantly intense reflections |
0.0281 |
| Weighted residual factors for significantly intense reflections |
0.0623 |
| Weighted residual factors for all reflections included in the refinement |
0.0648 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.111 |
| Diffraction radiation wavelength |
0.7288 Å |
| Diffraction radiation type |
synchrotron |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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