Information card for entry 2242909
| Chemical name |
<i>N</i>,<i>N</i>'-[(Ethane-1,2-diyl)bis(azanediylcarbonothioyl)]bis(benzamide) |
| Formula |
C18 H18 N4 O2 S2 |
| Calculated formula |
C18 H18 N4 O2 S2 |
| SMILES |
S=C(NCCNC(=S)NC(=O)c1ccccc1)NC(=O)c1ccccc1 |
| Title of publication |
Crystal structure of <i>N</i>,<i>N</i>'-[(ethane-1,2-diyl)bis(azanediylcarbonothioyl)]bis(benzamide) |
| Authors of publication |
Samb, Issa; Gaye, Nango; Sylla-Gueye, Rokhaya; Thiam, Elhadj Ibrahima; Gaye, Mohamed; Retailleau, Pascal |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2019 |
| Journal volume |
75 |
| Journal issue |
5 |
| Pages of publication |
642 - 645 |
| a |
11.225 ± 0.0006 Å |
| b |
7.2547 ± 0.0005 Å |
| c |
11.1397 ± 0.0006 Å |
| α |
90° |
| β |
100.978 ± 0.005° |
| γ |
90° |
| Cell volume |
890.55 ± 0.09 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0491 |
| Residual factor for significantly intense reflections |
0.0416 |
| Weighted residual factors for significantly intense reflections |
0.1153 |
| Weighted residual factors for all reflections included in the refinement |
0.1209 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.053 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2242909.html