Information card for entry 2243095
| Chemical name |
2,2''',6,6'''-Tetramethoxy-3,2':5',3'':6'',3'''-quaterpyridine |
| Formula |
C24 H22 N4 O4 |
| Calculated formula |
C24 H22 N4 O4 |
| SMILES |
O(c1nc(OC)ccc1c1ncc(cc1)c1cnc(cc1)c1ccc(OC)nc1OC)C |
| Title of publication |
Crystal structure and Hirshfeld surface analysis of 2,2''',6,6'''-tetramethoxy-3,2':5',3'':6'',3'''-quaterpyridine |
| Authors of publication |
Moon, Suk-Hee; Kim, Jinho; Park, Ki-Min; Kang, Youngjin |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2019 |
| Journal volume |
75 |
| Journal issue |
10 |
| Pages of publication |
1511 - 1514 |
| a |
7.9556 ± 0.0006 Å |
| b |
14.8583 ± 0.0011 Å |
| c |
17.3362 ± 0.0012 Å |
| α |
90° |
| β |
95.556 ± 0.004° |
| γ |
90° |
| Cell volume |
2039.6 ± 0.3 Å3 |
| Cell temperature |
223 ± 2 K |
| Ambient diffraction temperature |
223 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0742 |
| Residual factor for significantly intense reflections |
0.0537 |
| Weighted residual factors for significantly intense reflections |
0.1447 |
| Weighted residual factors for all reflections included in the refinement |
0.1598 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.041 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2243095.html