Information card for entry 2243216
| Chemical name |
(<i>E</i>)-3-(3-Iodophenyl)-1-(4-iodophenyl)prop-2-en-1-one |
| Formula |
C15 H10 I2 O |
| Calculated formula |
C15 H10 I2 O |
| SMILES |
c1(ccc(cc1)I)C(=O)/C=C/c1cc(ccc1)I |
| Title of publication |
Crystal structure and Hirshfeld surface analysis of (<i>E</i>)-3-(3-iodophenyl)-1-(4-iodophenyl)prop-2-en-1-one |
| Authors of publication |
Spruce, Kieran J.; Hall, Charlie L.; Potticary, Jason; Pridmore, Natalie E.; Cremeens, Matthew E.; D'ambruoso, Gemma D.; Matsumoto, Masaomi; Warren, Gabrielle I.; Warren, Stephen D.; Hall, Simon R. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2020 |
| Journal volume |
76 |
| Journal issue |
1 |
| Pages of publication |
72 - 76 |
| a |
7.265 ± 0.0007 Å |
| b |
32.864 ± 0.003 Å |
| c |
5.8446 ± 0.0006 Å |
| α |
90° |
| β |
92.277 ± 0.002° |
| γ |
90° |
| Cell volume |
1394.3 ± 0.2 Å3 |
| Cell temperature |
200 K |
| Ambient diffraction temperature |
200.01 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0402 |
| Residual factor for significantly intense reflections |
0.037 |
| Weighted residual factors for significantly intense reflections |
0.0721 |
| Weighted residual factors for all reflections included in the refinement |
0.0731 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.273 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2243216.html