Information card for entry 2243274
| Chemical name |
1,4,8,11-Tetramethyl-1,4,8,11-tetraazoniacyclotetradecane bis(perchlorate) dichloride |
| Formula |
C14 H36 Cl4 N4 O8 |
| Calculated formula |
C14 H36 Cl4 N4 O8 |
| SMILES |
C1C[NH+](C)CC[NH+](C)CCC[NH+](C)CC[NH+](C1)C.[O-]Cl(=O)(=O)=O.[Cl-].[O-]Cl(=O)(=O)=O.[Cl-] |
| Title of publication |
Crystal structure of 1,4,8,11-tetramethyl-1,4,8,11-tetraazoniacyclotetradecane bis(perchlorate) dichloride from synchrotron X-ray data |
| Authors of publication |
Moon, Dohyun; Choi, Jong-Ha |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2020 |
| Journal volume |
76 |
| Journal issue |
3 |
| Pages of publication |
324 - 327 |
| a |
7.499 ± 0.0015 Å |
| b |
8.079 ± 0.0016 Å |
| c |
9.98 ± 0.002 Å |
| α |
81.31 ± 0.03° |
| β |
77.32 ± 0.03° |
| γ |
78.39 ± 0.03° |
| Cell volume |
574.2 ± 0.2 Å3 |
| Cell temperature |
220 ± 2 K |
| Ambient diffraction temperature |
220 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.053 |
| Residual factor for significantly intense reflections |
0.0522 |
| Weighted residual factors for significantly intense reflections |
0.1462 |
| Weighted residual factors for all reflections included in the refinement |
0.1473 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.045 |
| Diffraction radiation wavelength |
0.61 Å |
| Diffraction radiation type |
synchrotron |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2243274.html