Information card for entry 2243862
| Chemical name |
Diethyl 2,2-dioxo-4-(thiophen-2-yl)-1-[(thiophen-2-yl)methyl]-3,4,6,7,8,8a-hexahydro-1<i>H</i>-pyrrolo[2,1-<i>c</i>][1,4]thiazine-1,3-dicarboxylate |
| Formula |
C22 H28 N O6 S3 |
| Calculated formula |
C22 H28 N O6 S3 |
| Title of publication |
Crystal structure and Hirshfeld surface analysis of a pyrrolo-thiazine complex |
| Authors of publication |
Sribala, R.; Srinivasan, N.; Rajalaksmi, P.; Indumathi, S.; Krishnakumar, R.V. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2021 |
| Journal volume |
77 |
| Journal issue |
8 |
| Pages of publication |
770 - 774 |
| a |
10.6886 ± 0.0005 Å |
| b |
11.4878 ± 0.0005 Å |
| c |
11.8389 ± 0.0006 Å |
| α |
76.007 ± 0.001° |
| β |
65.584 ± 0.001° |
| γ |
63.213 ± 0.001° |
| Cell volume |
1178.87 ± 0.1 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0509 |
| Residual factor for significantly intense reflections |
0.0439 |
| Weighted residual factors for significantly intense reflections |
0.1271 |
| Weighted residual factors for all reflections included in the refinement |
0.1342 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.054 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
Yes |
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https://www.crystallography.net/2243862.html