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Information card for entry 2244100
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| Coordinates | 2244100.cif |
|---|---|
| Structure factors | 2244100.hkl |
| Original IUCr paper | HTML |
| Common name | Hypoxanthinium bromide monohydrate |
|---|---|
| Chemical name | 6-Oxo-6,9-dihydro-1<i>H</i>-purin-7-ium bromide monohydrate |
| Formula | C5 H7 Br N4 O2 |
| Calculated formula | C5 H7 Br N4 O2 |
| SMILES | [Br-].O=c1[nH]cnc2[nH]c[nH+]c12.O |
| Title of publication | A study of the crystal structures, supramolecular patterns and Hirshfeld surfaces of bromide salts of hypoxanthine and xanthine |
| Authors of publication | Sathya, Udhayasuriyan; Nirmalram, Jeyaraman Selvaraj; Gomathi, Sundaramoorthy; Dhivya, Durairaj; Jegan Jennifer, Samson; Abdul Razak, Ibrahim |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2022 |
| Journal volume | 78 |
| Journal issue | 6 |
| a | 4.8487 ± 0.0004 Å |
| b | 18.4455 ± 0.0015 Å |
| c | 9.0782 ± 0.0007 Å |
| α | 90° |
| β | 94.808 ± 0.001° |
| γ | 90° |
| Cell volume | 809.07 ± 0.11 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0276 |
| Residual factor for significantly intense reflections | 0.0213 |
| Weighted residual factors for significantly intense reflections | 0.0536 |
| Weighted residual factors for all reflections included in the refinement | 0.0561 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
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The link is: https://www.crystallography.net/2244100.html
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Users of the data should acknowledge the original authors of the
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