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Information card for entry 2300306
Preview
| Coordinates | 2300306.cif |
|---|---|
| Original IUCr paper | HTML |
| External links | PubChem |
| Formula | C14 H14 O2 S |
|---|---|
| Calculated formula | C14 H14 O2 S |
| SMILES | O=S(=O)(Cc1ccccc1)Cc1ccccc1 |
| Title of publication | Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? |
| Authors of publication | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. |
| Journal of publication | Journal of Applied Crystallography |
| Year of publication | 2011 |
| Journal volume | 44 |
| Journal issue | 1 |
| Pages of publication | 213 - 215 |
| a | 24.012 ± 0.003 Å |
| b | 4.7429 ± 0.0005 Å |
| c | 10.8321 ± 0.0013 Å |
| α | 90° |
| β | 90.197 ± 0.004° |
| γ | 90° |
| Cell volume | 1233.6 ± 0.3 Å3 |
| Cell temperature | 300 ± 2 K |
| Ambient diffraction temperature | 300 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0439 |
| Residual factor for significantly intense reflections | 0.0375 |
| Weighted residual factors for significantly intense reflections | 0.1154 |
| Weighted residual factors for all reflections included in the refinement | 0.1217 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.204 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Suboptimal structure of | 2300305 |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2300306.html
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Users of the data should acknowledge the original authors of the
structural data.