Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Authors of publication
Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Journal of publication
Journal of Applied Crystallography
Year of publication
2011
Journal volume
44
Journal issue
1
Pages of publication
213 - 215
a
5.6095 ± 0.001 Å
b
7.3299 ± 0.0015 Å
c
12.491 ± 0.002 Å
α
90°
β
93.297 ± 0.005°
γ
90°
Cell volume
512.74 ± 0.16 Å3
Cell temperature
291 ± 2 K
Ambient diffraction temperature
291 ± 2 K
Number of distinct elements
5
Space group number
4
Hermann-Mauguin space group symbol
P 1 21 1
Hall space group symbol
P 2yb
Residual factor for all reflections
0.0337
Residual factor for significantly intense reflections
0.0305
Weighted residual factors for significantly intense reflections
0.0704
Weighted residual factors for all reflections included in the refinement
0.0725
Goodness-of-fit parameter for all reflections included in the refinement