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Information card for entry 2300424
Preview
| Coordinates | 2300424.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C6 H5 I N2 O2 |
|---|---|
| Calculated formula | C6 H5 I N2 O2 |
| SMILES | Ic1c(N)ccc(N(=O)=O)c1 |
| Title of publication | Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist? |
| Authors of publication | Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E. |
| Journal of publication | Journal of Applied Crystallography |
| Year of publication | 2011 |
| Journal volume | 44 |
| Journal issue | 1 |
| Pages of publication | 213 - 215 |
| a | 7.7617 ± 0.0015 Å |
| b | 12.912 ± 0.003 Å |
| c | 15.663 ± 0.003 Å |
| α | 90° |
| β | 95.141 ± 0.006° |
| γ | 90° |
| Cell volume | 1563.4 ± 0.6 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 300 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.038 |
| Residual factor for significantly intense reflections | 0.0256 |
| Weighted residual factors for significantly intense reflections | 0.0522 |
| Weighted residual factors for all reflections included in the refinement | 0.0561 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Duplicate of | 2300334 |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2300424.html
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Users of the data should acknowledge the original authors of the
structural data.