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Information card for entry 2300754
Preview
| Coordinates | 2300754.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | nickel terephthalate trihydrate |
|---|---|
| Formula | C8 H10 Ni O7 |
| Calculated formula | C8 H10 Ni O7 |
| Title of publication | A comparison of microcrystal electron diffraction and X-ray powder diffraction for the structural analysis of metal-organic frameworks. |
| Authors of publication | Biehler, Erik; Pagola, Silvina; Stam, Daniel; Merkelbach, Johannes; Jandl, Christian; Abdel-Fattah, Tarek M |
| Journal of publication | Journal of applied crystallography |
| Year of publication | 2025 |
| Journal volume | 58 |
| Journal issue | Pt 2 |
| Pages of publication | 398 - 411 |
| a | 20.31 ± 0.05 Å |
| b | 22.85 ± 0.05 Å |
| c | 6.226 ± 0.014 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2889 ± 12 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 4 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.207 |
| Residual factor for significantly intense reflections | 0.1157 |
| Weighted residual factors for significantly intense reflections | 0.2274 |
| Weighted residual factors for all reflections included in the refinement | 0.2467 |
| Goodness-of-fit parameter for significantly intense reflections | 0 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.7456 |
| Diffraction radiation probe | electron |
| Diffraction radiation wavelength | 0.02851 Å |
| Diffraction radiation type | electron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/2300754.html
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