Statistical analysis of multipole-model-derived structural parameters and charge-density properties from high-resolution X-ray diffraction experiments
Authors of publication
Kamiński, Radosław; Domagała, Sławomir; Jarzembska, Katarzyna N.; Hoser, Anna A.; Sanjuan-Szklarz, W. Fabiola; Gutmann, Matthias J.; Makal, Anna; Malińska, Maura; Bak, Joanna M.; Woźniak, Krzysztof
Journal of publication
Acta Crystallographica Section A
Year of publication
2014
Journal volume
70
Journal issue
1
Pages of publication
72 - 91
a
6.0903 ± 0.0002 Å
b
3.4959 ± 0.0001 Å
c
11.8348 ± 0.0003 Å
α
90°
β
103.917 ± 0.001°
γ
90°
Cell volume
244.579 ± 0.012 Å3
Cell temperature
100 ± 1 K
Ambient diffraction temperature
100 ± 1 K
Number of distinct elements
3
Space group number
14
Hermann-Mauguin space group symbol
P 1 21/c 1
Hall space group symbol
-P 2ybc
Residual factor for all reflections
0.0166
Residual factor for significantly intense reflections
0.0166
Weighted residual factors for significantly intense reflections
0.0184
Weighted residual factors for all reflections included in the refinement
0.0184
Goodness-of-fit parameter for all reflections included in the refinement