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Information card for entry 2311778
Preview
| Coordinates | 2311778.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Ba2 O13 Pr2 Si4 |
|---|---|
| Calculated formula | Ba2 O13 Pr2 Si4 |
| Title of publication | Crystal chemistry and the role of ionic radius in rare earth tetrasilicates: Ba<sub>2</sub>RE<sub>2</sub>Si<sub>4</sub>O<sub>12</sub>F<sub>2</sub> (RE = Er<sup>3+</sup>-Lu<sup>3+</sup>) and Ba<sub>2</sub>RE<sub>2</sub>Si<sub>4</sub>O<sub>13</sub> (RE = La<sup>3+</sup>-Ho<sup>3+</sup>). |
| Authors of publication | Fulle, Kyle; Sanjeewa, Liurukara D.; McMillen, Colin D.; Kolis, Joseph W. |
| Journal of publication | Acta crystallographica Section B, Structural science, crystal engineering and materials |
| Year of publication | 2017 |
| Journal volume | 73 |
| Journal issue | Pt 5 |
| Pages of publication | 907 - 915 |
| a | 6.688 ± 0.0003 Å |
| b | 8.953 ± 0.0004 Å |
| c | 10.1324 ± 0.0004 Å |
| α | 86.5023 ± 0.0013° |
| β | 73.5481 ± 0.0013° |
| γ | 86.2929 ± 0.0015° |
| Cell volume | 580.07 ± 0.04 Å3 |
| Cell temperature | 300 ± 2 K |
| Ambient diffraction temperature | 300 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0222 |
| Residual factor for significantly intense reflections | 0.0205 |
| Weighted residual factors for significantly intense reflections | 0.05 |
| Weighted residual factors for all reflections included in the refinement | 0.0507 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.165 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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