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Information card for entry 2312825
Preview
| Coordinates | 2312825.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Tin(IV) Dilead Oxide |
|---|---|
| Formula | O4 Pb2 Sn |
| Calculated formula | O4 Pb2 Sn |
| Title of publication | Pressure-induced Pb-Pb bonding and phase transition in Pb<sub>2</sub>SnO<sub>4</sub>. |
| Authors of publication | Spahr, Dominik; Stękiel, Michał; Zimmer, Dominik; Bayarjargal, Lkhamsuren; Bunk, Katja; Morgenroth, Wolfgang; Milman, Victor; Refson, Keith; Jochym, Dominik; Byrne, Peter J. P.; Winkler, Björn |
| Journal of publication | Acta crystallographica Section B, Structural science, crystal engineering and materials |
| Year of publication | 2020 |
| Journal volume | 76 |
| Journal issue | Pt 6 |
| Pages of publication | 979 - 991 |
| a | 9.2484 ± 0.0008 Å |
| b | 6.4498 ± 0.0009 Å |
| c | 6.4096 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 382.33 ± 0.06 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Cell measurement pressure | 12400000 ± 700000 kPa |
| Number of distinct elements | 3 |
| Space group number | 62 |
| Hermann-Mauguin space group symbol | P n a m |
| Hall space group symbol | -P 2c 2n |
| Residual factor for all reflections | 0.0205 |
| Residual factor for significantly intense reflections | 0.0187 |
| Weighted residual factors for significantly intense reflections | 0.0226 |
| Weighted residual factors for all reflections included in the refinement | 0.0235 |
| Goodness-of-fit parameter for significantly intense reflections | 1.17 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.16 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.28988 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2312825.html
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Users of the data should acknowledge the original authors of the
structural data.