Information card for entry 3000627

Structure parameters

• Formula: C140 H188 Br2 O22 S2 Si2
• Authors of publication: Yosuke Tani
• Journal of publication: To be published
• a: 12.5208 ± 0.0009 Å
• b: 14.46 ± 0.0009 Å
• c: 19.6291 ± 0.0016 Å
• α: 83.559 ± 0.006°
• β: 80.254 ± 0.007°
• γ: 79.2 ± 0.006°
• Cell volume: 3428.6 ± 0.4 ų
• Cell temperature: 79 K
• Ambient diffraction temperature: 79 K
• Number of distinct elements: 6
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.2205
• Residual factor for significantly intense reflections: 0.1704
• Weighted residual factors for significantly intense reflections: 0.3876
• Weighted residual factors for all reflections included in the refinement: 0.4086
• Goodness-of-fit parameter for all reflections included in the refinement: 1.186
• Diffraction radiation probe: electron
• Diffraction radiation wavelength: 0.02508 Å
• Diffraction radiation type: electron
• Has coordinates: No
• Has disorder: No
• Has Fobs: No