Information card for entry 3000633
No preview available: structure is on hold until 2026-08-05
| Formula |
C14 H12 N2 O3 |
| Authors of publication |
Ishikawa, Kazuki; Yoshizawa, Fumishi; Aihara, Reon; Funato, Norihito; Nakane, Daisuke; Akitsu, Takashiro; Nakane, Takanori; Kawamoto, Akihiro; Kurisu, Genji |
| Journal of publication |
To be published in Acta Crystallographica Section E |
| a |
9.981 ± 0.009 Å |
| b |
12.866 ± 0.005 Å |
| c |
8.083 ± 0.006 Å |
| α |
90° |
| β |
92.43 ± 0.07° |
| γ |
90° |
| Cell volume |
1037 ± 1.3 Å3 |
| Cell temperature |
79 K |
| Ambient diffraction temperature |
79 K |
| Number of distinct elements |
4 |
| Hermann-Mauguin space group symbol |
C 1 c 1 |
| Hall space group symbol |
C -2yc |
| Residual factor for all reflections |
0.1601 |
| Residual factor for significantly intense reflections |
0.0981 |
| Weighted residual factors for significantly intense reflections |
0.2284 |
| Weighted residual factors for all reflections included in the refinement |
0.2555 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.9105 |
| Diffraction radiation probe |
electron |
| Diffraction radiation wavelength |
0.02508 Å |
| Diffraction radiation type |
electron |
| Has coordinates |
No |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/3000633.html