Information card for entry 4000042
| Chemical name |
spiro[4,5]([2,1-b:3,4-b']dithieno)decane |
| Formula |
C14 H14 S2 |
| Calculated formula |
C14 H14 S2 |
| SMILES |
C1CCC2(CC1)c1ccsc1c1c2ccs1 |
| Title of publication |
Steric Control of Conductivity in Highly Conjugated Polythiophenes |
| Authors of publication |
Benincori, T.; Consonni, V.; Gramatica, P.; Pilati, T.; Rizzo, S.; Sannicolo,́ F.; Todeschini, R'; Zotti, G. |
| Journal of publication |
Chemistry of Materials |
| Year of publication |
2001 |
| Journal volume |
13 |
| Journal issue |
5 |
| Pages of publication |
1665 - 1673 |
| a |
15.7886 ± 0.0011 Å |
| b |
10.0214 ± 0.0007 Å |
| c |
16.142 ± 0.0012 Å |
| α |
90° |
| β |
106.046 ± 0.006° |
| γ |
90° |
| Cell volume |
2454.5 ± 0.3 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0542 |
| Residual factor for significantly intense reflections |
0.038 |
| Weighted residual factors for all reflections |
0.1002 |
| Weighted residual factors for significantly intense reflections |
0.0896 |
| Goodness-of-fit parameter for all reflections |
1.022 |
| Goodness-of-fit parameter for significantly intense reflections |
1.043 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4000042.html