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Information card for entry 4000726
Preview
| Coordinates | 4000726.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H40 N6 S4 Zn |
|---|---|
| Calculated formula | C20 H40 N6 S4 Zn |
| SMILES | CCN(C1=[N]C(N(CC)CC)=[S][Zn]2(S1)[S]=C(N(CC)CC)N=C(N(CC)CC)S2)CC |
| Title of publication | Thio- and Dithio-Biuret Precursors for Zinc Sulfide, Cadmium Sulfide, and Zinc Cadmium Sulfide Thin Films |
| Authors of publication | Ramasamy, Karthik; Malik, Mohammad A.; Helliwell, Madeleine; Raftery, James; O’Brien, Paul |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2011 |
| Journal volume | 23 |
| Journal issue | 6 |
| Pages of publication | 1471 |
| a | 9.092 ± 0.0008 Å |
| b | 11.5052 ± 0.001 Å |
| c | 26.955 ± 0.002 Å |
| α | 90° |
| β | 98.799 ± 0.002° |
| γ | 90° |
| Cell volume | 2786.5 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0686 |
| Residual factor for significantly intense reflections | 0.036 |
| Weighted residual factors for significantly intense reflections | 0.0492 |
| Weighted residual factors for all reflections included in the refinement | 0.0541 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.743 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4000726.html
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