Information card for entry 4000785
| Common name |
rubrene endoperoxide dioxane solvate |
| Chemical name |
5,6,11,12-tetraphenyl-5,6-epidioxytetracene dioxane solvate |
| Formula |
C50 H44 O6 |
| Calculated formula |
C50 H44 O6 |
| SMILES |
O1CCOCC1.O1CCOCC1.c1ccc(cc1)c1c2ccccc2c(c2c1[C@]1(OO[C@]2(c2ccccc2)c2c1cccc2)c1ccccc1)c1ccccc1 |
| Title of publication |
Oxidation Dynamics of Epitaxial Rubrene Ultrathin Films |
| Authors of publication |
Fumagalli, Enrico; Raimondo, Luisa; Silvestri, Leonardo; Moret, Massimo; Sassella, Adele; Campione, Marcello |
| Journal of publication |
Chemistry of Materials |
| Year of publication |
2011 |
| Journal volume |
23 |
| Journal issue |
13 |
| Pages of publication |
3246 |
| a |
7.6249 ± 0.0006 Å |
| b |
11.1636 ± 0.0009 Å |
| c |
22.6554 ± 0.0019 Å |
| α |
101.703 ± 0.001° |
| β |
94.307 ± 0.001° |
| γ |
97.867 ± 0.001° |
| Cell volume |
1860 ± 0.3 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0691 |
| Residual factor for significantly intense reflections |
0.0481 |
| Weighted residual factors for significantly intense reflections |
0.1174 |
| Weighted residual factors for all reflections included in the refinement |
0.1294 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.031 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4000785.html