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Information card for entry 4000822
Preview
| Coordinates | 4000822.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H28 N2 O6 |
|---|---|
| Calculated formula | C40 H28 N2 O6 |
| SMILES | [O-]C1=C(C(C1=c1c(O)cc(cc1O)=[N+](c1ccccc1)c1ccccc1)=O)c1c(O)cc(cc1O)N(c1ccccc1)c1ccccc1 |
| Title of publication | N,N-Diarylanilinosquaraines and Their Application to Organic Photovoltaics |
| Authors of publication | Wang, Siyi; Hall, Lincoln; Diev, Vyacheslav V.; Haiges, Ralf; Wei, Guodan; Xiao, Xin; Djurovich, Peter I.; Forrest, Stephen R.; Thompson, Mark E. |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2011 |
| Journal volume | 23 |
| Journal issue | 21 |
| Pages of publication | 4789 |
| a | 11.1895 ± 0.0009 Å |
| b | 11.7874 ± 0.0011 Å |
| c | 11.9792 ± 0.0009 Å |
| α | 96.371 ± 0.008° |
| β | 91.176 ± 0.007° |
| γ | 92.485 ± 0.007° |
| Cell volume | 1568.3 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1154 |
| Residual factor for significantly intense reflections | 0.0819 |
| Weighted residual factors for significantly intense reflections | 0.224 |
| Weighted residual factors for all reflections included in the refinement | 0.2434 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.084 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Duplicate of | 4000821 |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4000822.html
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Users of the data should acknowledge the original authors of the
structural data.