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Information card for entry 4001462
Preview
| Coordinates | 4001462.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Indium Bismuth Selenobromide |
|---|---|
| Formula | Bi2 Br In Se4 |
| Calculated formula | Bi2 Br In Se4 |
| Title of publication | A New Series of Chalcohalide Semiconductors with Composite CdBr2/Sb2Se3Lattices: Synthesis and Characterization of CdSb2Se3Br2and Indium Derivatives InSb2S4X (X = Cl and Br) and InM2Se4Br (M = Sb and Bi) |
| Authors of publication | Wang, Lei; Hwu, Shiou-Jyh |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2007 |
| Journal volume | 19 |
| Journal issue | 25 |
| Pages of publication | 6212 |
| a | 20.832 ± 0.004 Å |
| b | 4.114 ± 0.0008 Å |
| c | 11.958 ± 0.002 Å |
| α | 90° |
| β | 118.15 ± 0.03° |
| γ | 90° |
| Cell volume | 903.6 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.0278 |
| Residual factor for significantly intense reflections | 0.0263 |
| Weighted residual factors for significantly intense reflections | 0.0595 |
| Weighted residual factors for all reflections included in the refinement | 0.0604 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.202 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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