Information card for entry 4001542

Structure parameters

• Formula: C24 H56 Cu4 O8 P4 Se8
• Calculated formula: C24 H56 Cu4 O8 P4 Se8
• SMILES: [Cu]12345[Cu]6789[Cu]%10%111([Cu]26([Se]3P(=[Se]7)(OC(C)C)OC(C)C)([Se]=P([Se]5%10)(OC(C)C)OC(C)C)[Se]9P(=[Se]%11)(OC(C)C)OC(C)C)[Se]8P(=[Se]4)(OC(C)C)OC(C)C
• Title of publication: [Cu4{Se2P(OiPr)2}4]: A Novel Precursor Enabling Preparation of Nonstoichiometric Copper Selenide (Cu2-xSe) Nanowires
• Authors of publication: Hsu, Yung-Jung; Hung, Chiu-Ming; Lin, Yi-Feng; Liaw, Ben-Jie; Lobana, Tarlok S.; Lu, Shih-Yuan; Liu, C. W.
• Journal of publication: Chemistry of Materials
• Year of publication: 2006
• Journal volume: 18
• Journal issue: 14
• Pages of publication: 3323
• a: 11.692 ± 0.004 Å
• b: 18.023 ± 0.007 Å
• c: 11.772 ± 0.005 Å
• α: 90°
• β: 90.71 ± 0.02°
• γ: 90°
• Cell volume: 2480.5 ± 1.7 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 6
• Space group number: 7
• Hermann-Mauguin space group symbol: P 1 n 1
• Hall space group symbol: P -2yac
• Residual factor for all reflections: 0.0859
• Residual factor for significantly intense reflections: 0.0712
• Weighted residual factors for significantly intense reflections: 0.1462
• Weighted residual factors for all reflections included in the refinement: 0.1534
• Goodness-of-fit parameter for all reflections included in the refinement: 1.025
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No