Information card for entry 4003412
| Formula |
C88 H96 N6 |
| Calculated formula |
C88 H96 N6 |
| Title of publication |
Persistent Dimer Emission in Thermally Activated Delayed Fluorescence Materials. |
| Authors of publication |
Etherington, Marc K.; Kukhta, Nadzeya A.; Higginbotham, Heather F.; Danos, Andrew; Bismillah, Aisha N.; Graves, David R.; McGonigal, Paul R.; Haase, Nils; Morherr, Antonia; Batsanov, Andrei S.; Pflumm, Christof; Bhalla, Vandana; Bryce, Martin R.; Monkman, Andrew P. |
| Journal of publication |
The journal of physical chemistry. C, Nanomaterials and interfaces |
| Year of publication |
2019 |
| Journal volume |
123 |
| Journal issue |
17 |
| Pages of publication |
11109 - 11117 |
| a |
11.2959 ± 0.0005 Å |
| b |
11.6028 ± 0.0005 Å |
| c |
15.7669 ± 0.0007 Å |
| α |
102.481 ± 0.0016° |
| β |
96.643 ± 0.0016° |
| γ |
116.453 ± 0.0015° |
| Cell volume |
1752.48 ± 0.14 Å3 |
| Cell temperature |
120 K |
| Ambient diffraction temperature |
120 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.081 |
| Residual factor for significantly intense reflections |
0.0506 |
| Weighted residual factors for significantly intense reflections |
0.1174 |
| Weighted residual factors for all reflections included in the refinement |
0.1298 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.022 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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https://www.crystallography.net/4003412.html
