Information card for entry 4003941
| Formula |
O232 Si116 |
| Calculated formula |
O232 Si116 |
| Title of publication |
EMM-25: The Structure of Two-Dimensional 11 ×10 Medium-Pore Borosilicate Zeolite Unraveled Using 3D Electron Diffraction |
| Authors of publication |
Cho, Jung; Yun, Yifeng; Xu, Hongyi; Sun, Junliang; Burton, Allen W.; Strohmaier, Karl G.; Terefenko, Gene; Vroman, Hilda; Afeworki, Mobae; Cao, Guang; Wang, Hao; Zou, Xiaodong; Willhammar, Tom |
| Journal of publication |
Chemistry of Materials |
| Year of publication |
2021 |
| a |
11.055 ± 0.002 Å |
| b |
22.912 ± 0.005 Å |
| c |
24.914 ± 0.005 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
6311 ± 2 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
2 |
| Space group number |
63 |
| Hermann-Mauguin space group symbol |
C m c m |
| Hall space group symbol |
-C 2c 2 |
| Residual factor for all reflections |
0.2133 |
| Residual factor for significantly intense reflections |
0.1938 |
| Weighted residual factors for significantly intense reflections |
0.4486 |
| Weighted residual factors for all reflections included in the refinement |
0.4635 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.685 |
| Diffraction radiation wavelength |
0.02508 Å |
| Diffraction radiation type |
electron |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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