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Information card for entry 4022216
Preview
| Coordinates | 4022216.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H26 B Cl8 Cu F4 N4 |
|---|---|
| Calculated formula | C34 H26 B Cl8 Cu F4 N4 |
| SMILES | [Cu]1([N](=Cc2c(Cl)cccc2Cl)c2cccc(c2c2c(cccc2[N]1=Cc1c(Cl)cccc1Cl)C)C)([N]#CC)[N]#CC.ClCCl.ClCCl.[B](F)(F)(F)[F-] |
| Title of publication | Enantioselective Aziridination Using Copper Complexes of Biaryl Schiff Bases |
| Authors of publication | Kevin M. Gillespie; Christopher J. Sanders; Paul O'Shaughnessy; Ian Westmoreland; Christopher P. Thickitt; Peter Scott |
| Journal of publication | Journal of Organic Chemistry |
| Year of publication | 2002 |
| Journal volume | 67 |
| Pages of publication | 3450 - 3458 |
| a | 13.2095 ± 0.0005 Å |
| b | 23.9347 ± 0.0005 Å |
| c | 25.5398 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 8074.8 ± 0.5 Å3 |
| Cell temperature | 183 ± 2 K |
| Ambient diffraction temperature | 183 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.102 |
| Residual factor for significantly intense reflections | 0.0895 |
| Weighted residual factors for significantly intense reflections | 0.264 |
| Weighted residual factors for all reflections included in the refinement | 0.2723 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.131 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4022216.html
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