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Information card for entry 4022385
Preview
| Coordinates | 4022385.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H26 Cl2 O8 S2 |
|---|---|
| Calculated formula | C22 H28 Cl2 O8 S2 |
| SMILES | [S+]12c3ccccc3[S+](c3ccccc13)[C@H]([C@H]2CCCC)CCCC.Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-] |
| Title of publication | Adducts of Phenoxathiin and Thianthrene Cation Radicals with Alkenes and Cycloalkenes |
| Authors of publication | Henry J. Shine; Bingjun Zhao; Ding-Quan Qian; John N. Marx; Ilse Y. Guzmán-Jiménez; John H. Thurston; T. Ould-Ely; Kenton H. Whitmire |
| Journal of publication | Journal of Organic Chemistry |
| Year of publication | 2003 |
| Journal volume | 68 |
| Pages of publication | 8910 - 8917 |
| a | 9.431 ± 0.003 Å |
| b | 16.61 ± 0.005 Å |
| c | 16.074 ± 0.004 Å |
| α | 90° |
| β | 92.771 ± 0.006° |
| γ | 90° |
| Cell volume | 2515 ± 1.2 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1279 |
| Residual factor for significantly intense reflections | 0.078 |
| Weighted residual factors for significantly intense reflections | 0.2177 |
| Weighted residual factors for all reflections included in the refinement | 0.2448 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.008 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4022385.html
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