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Information card for entry 4030228
Preview
| Coordinates | 4030228.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H22 N2 O4 |
|---|---|
| Calculated formula | C20 H22 N2 O4 |
| SMILES | C1C=C2[C@H](C[C@H]3[C@@H](C2(C=C)C=C)C(=O)N(C3=O)C)[C@H]2[C@@H]1C(=O)N(C)C2=O |
| Title of publication | Computational and synthetic studies with tetravinylethylenes. |
| Authors of publication | Lindeboom, Erik J.; Willis, Anthony C.; Paddon-Row, Michael N; Sherburn, Michael S. |
| Journal of publication | The Journal of organic chemistry |
| Year of publication | 2014 |
| Journal volume | 79 |
| Journal issue | 23 |
| Pages of publication | 11496 - 11507 |
| a | 7.4676 ± 0.0002 Å |
| b | 6.9456 ± 0.0001 Å |
| c | 17.1815 ± 0.0004 Å |
| α | 90° |
| β | 102.013 ± 0.0011° |
| γ | 90° |
| Cell volume | 871.64 ± 0.03 Å3 |
| Cell temperature | 200 K |
| Ambient diffraction temperature | 200 K |
| Number of distinct elements | 4 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0324 |
| Residual factor for significantly intense reflections | 0.0304 |
| Weighted residual factors for all reflections | 0.0816 |
| Weighted residual factors for significantly intense reflections | 0.0802 |
| Weighted residual factors for all reflections included in the refinement | 0.0816 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.0033 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4030228.html
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Users of the data should acknowledge the original authors of the
structural data.