Information card for entry 4034021
| Formula |
C16 H14 N2 O S |
| Calculated formula |
C16 H14 N2 O S |
| SMILES |
S(c1ccccc1)C1C(OC(C=1C)(C)C)=C(C#N)C#N |
| Title of publication |
4,5,5-Trimethyl-2,5-dihydrofuran-Based Electron-Withdrawing Groups for NIR-Emitting Push-Pull Dipolar Fluorophores. |
| Authors of publication |
Rémond, Maxime; Zheng, Zheng; Jeanneau, Erwann; Andraud, Chantal; Bretonnière, Yann; Redon, Sébastien |
| Journal of publication |
The Journal of organic chemistry |
| Year of publication |
2019 |
| Journal volume |
84 |
| Journal issue |
16 |
| Pages of publication |
9965 - 9974 |
| a |
7.118 ± 0.0008 Å |
| b |
17.3683 ± 0.0017 Å |
| c |
11.5631 ± 0.0011 Å |
| α |
90° |
| β |
94.347 ± 0.01° |
| γ |
90° |
| Cell volume |
1425.4 ± 0.3 Å3 |
| Cell temperature |
149.99 ± 0.1 K |
| Ambient diffraction temperature |
149.99 ± 0.1 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0578 |
| Residual factor for significantly intense reflections |
0.0442 |
| Weighted residual factors for all reflections |
0.0791 |
| Weighted residual factors for significantly intense reflections |
0.0666 |
| Weighted residual factors for all reflections included in the refinement |
0.0791 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.0181 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/4034021.html