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Information card for entry 4035491
Preview
| Coordinates | 4035491.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C21 H32 O3 |
|---|---|
| Calculated formula | C21 H32 O3 |
| SMILES | O(C(=O)[C@@]1(CCC[C@@]2([C@H]3CCC(=C[C@@H]3C(=O)C[C@@H]12)C(C)C)C)C)C |
| Title of publication | In Depth Analysis of Chiroptical Properties of Enones Derived from Abietic Acid. |
| Authors of publication | Masnyk, Marek; Butkiewicz, Aleksandra; Górecki, Marcin; Luboradzki, Roman; Paluch, Piotr; Potrzebowski, Marek J.; Frelek, Jadwiga |
| Journal of publication | The Journal of organic chemistry |
| Year of publication | 2018 |
| Journal volume | 83 |
| Journal issue | 7 |
| Pages of publication | 3547 - 3561 |
| a | 8.722 ± 0.0001 Å |
| b | 11.3175 ± 0.0001 Å |
| c | 18.7629 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1852.11 ± 0.03 Å3 |
| Cell temperature | 100 ± 1 K |
| Ambient diffraction temperature | 100 ± 1 K |
| Number of distinct elements | 3 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.043 |
| Residual factor for significantly intense reflections | 0.0427 |
| Weighted residual factors for significantly intense reflections | 0.112 |
| Weighted residual factors for all reflections included in the refinement | 0.1123 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4035491.html
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Users of the data should acknowledge the original authors of the
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