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Information card for entry 4038310
Preview
| Coordinates | 4038310.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C45 H53 Fe N4 O4 P |
|---|---|
| Calculated formula | C45 H53 Fe N4 O4 P |
| SMILES | [Fe]([P](C(=C1N(C=CN1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C)c1ccccc1)=C1N(C(=C(N1C)C)C)C)(C#[O])(C#[O])(C#[O])C#[O] |
| Title of publication | Isolation of Elusive Electrophilic Phosphinidene Complexes with π-Donor N-Heterocyclic Vinyl Substituents. |
| Authors of publication | Rottschäfer, Dennis; Neumann, Beate; Stammler, Hans-Georg; Andrada, Diego Marcelo; Ghadwal, Rajendra S. |
| Journal of publication | The Journal of organic chemistry |
| Year of publication | 2020 |
| a | 10.3827 ± 0.0002 Å |
| b | 20.2897 ± 0.0004 Å |
| c | 20.0193 ± 0.0004 Å |
| α | 90° |
| β | 103.111 ± 0.002° |
| γ | 90° |
| Cell volume | 4107.37 ± 0.14 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0535 |
| Residual factor for significantly intense reflections | 0.0411 |
| Weighted residual factors for significantly intense reflections | 0.1048 |
| Weighted residual factors for all reflections included in the refinement | 0.112 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.045 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4038310.html
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Users of the data should acknowledge the original authors of the
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