Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4060524
Preview
| Coordinates | 4060524.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H84 Ce2 I2 N8 Si4 |
|---|---|
| Calculated formula | C38 H84 Ce2 I2 N8 Si4 |
| SMILES | C12N(C(C)(C)C)C=CN2CCN(C(C)(C)C)[Ce]2=1([I][Ce]1(=C3N(C=CN3C(C)(C)C)CCN1C(C)(C)C)([I]2)N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C |
| Title of publication | Synthesis of Heteroleptic Cerium(III) Anionic Amido-Tethered N-Heterocyclic Carbene Complexes |
| Authors of publication | Liddle, Stephen T.; Arnold, Polly L. |
| Journal of publication | Organometallics |
| Year of publication | 2005 |
| Journal volume | 24 |
| Journal issue | 11 |
| Pages of publication | 2597 - 2605 |
| a | 11.1998 ± 0.0007 Å |
| b | 11.5465 ± 0.0008 Å |
| c | 12.7282 ± 0.0008 Å |
| α | 70.256 ± 0.002° |
| β | 83.553 ± 0.002° |
| γ | 64.661 ± 0.002° |
| Cell volume | 1399.17 ± 0.16 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0229 |
| Residual factor for significantly intense reflections | 0.0199 |
| Weighted residual factors for significantly intense reflections | 0.047 |
| Weighted residual factors for all reflections included in the refinement | 0.0485 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4060524.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.