Information card for entry 4060713

Structure parameters

• Formula: C21 H44 N4 Si3 Sn
• Calculated formula: C21 H44 N4 Si3 Sn
• SMILES: [Sn]123(N([Si](C)(C)C)CC[N]1(CCN2[Si](C)(C)C)CCN3[Si](C)(C)C)c1ccccc1
• Title of publication: Azametallatranes of Group 14 Elements. Syntheses and X-ray Studies
• Authors of publication: Shutov, Pavel L.; Sorokin, Denis A.; Karlov, Sergey S.; Harms, Klaus; Oprunenko, Yuri F.; Churakov, Andrei V.; Antipin, Mikhail Yu.; Zaitseva, Galina S.; Lorberth, Jörg
• Journal of publication: Organometallics
• Year of publication: 2003
• Journal volume: 22
• Journal issue: 3
• Pages of publication: 516 - 522
• a: 10.7581 ± 0.0008 Å
• b: 16.2673 ± 0.0012 Å
• c: 17.8259 ± 0.0013 Å
• α: 73.644 ± 0.006°
• β: 88.022 ± 0.006°
• γ: 72.245 ± 0.005°
• Cell volume: 2846.3 ± 0.4 ų
• Cell temperature: 193 ± 2 K
• Ambient diffraction temperature: 193 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0252
• Residual factor for significantly intense reflections: 0.0204
• Weighted residual factors for significantly intense reflections: 0.05
• Weighted residual factors for all reflections included in the refinement: 0.0508
• Goodness-of-fit parameter for all reflections included in the refinement: 0.952
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No