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Information card for entry 4063546
Preview
| Coordinates | 4063546.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C52 H49 P3 Pd S Si |
|---|---|
| Calculated formula | C52 H49 P3 Pd S Si |
| SMILES | C[Si](C)(C)[C]1(P(c2ccccc2)c2ccccc2)[Pd]([P](c2ccccc2)(c2ccccc2)c2ccccc2)([P](c2ccccc2)(c2ccccc2)c2ccccc2)[S]=1 |
| Title of publication | Formation of a Palladium Thioketone Complex from a Thiophosphinoyl Stabilized Li/Cl Carbenoid |
| Authors of publication | Gessner, Viktoria H. |
| Journal of publication | Organometallics |
| Year of publication | 2011 |
| Journal volume | 30 |
| Journal issue | 16 |
| Pages of publication | 4228 |
| a | 11.382 ± 0.003 Å |
| b | 13.542 ± 0.003 Å |
| c | 15.957 ± 0.004 Å |
| α | 79.574 ± 0.003° |
| β | 74.649 ± 0.004° |
| γ | 77.131 ± 0.004° |
| Cell volume | 2292.7 ± 1 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0415 |
| Residual factor for significantly intense reflections | 0.035 |
| Weighted residual factors for significantly intense reflections | 0.0915 |
| Weighted residual factors for all reflections included in the refinement | 0.0954 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4063546.html
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Users of the data should acknowledge the original authors of the
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