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Information card for entry 4063633
Preview
| Coordinates | 4063633.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H62 F4 Ni2 P4 |
|---|---|
| Calculated formula | C30 H62 F4 Ni2 P4 |
| SMILES | [Ni]1([P](CC)(CC)CC)([P](CC)(CC)CC)[C]2(F)[C]3([Ni]([P](CC)(CC)CC)([P](CC)(CC)CC)[CH]=3C(=C(F)[CH]1=2)F)F |
| Title of publication | Characterization of Intermediates in the C−F Activation of Tetrafluorobenzenes using a Reactive Ni(PEt3)2Synthon: Combined Computational and Experimental Investigation |
| Authors of publication | Johnson, Samuel A.; Mroz, Natalia M.; Valdizon, René; Murray, Scott |
| Journal of publication | Organometallics |
| Year of publication | 2011 |
| Journal volume | 30 |
| Journal issue | 3 |
| Pages of publication | 441 |
| a | 14.8226 ± 0.0016 Å |
| b | 13.4117 ± 0.0014 Å |
| c | 23.6234 ± 0.0018 Å |
| α | 90° |
| β | 126.885 ± 0.004° |
| γ | 90° |
| Cell volume | 3756.3 ± 0.7 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0366 |
| Residual factor for significantly intense reflections | 0.031 |
| Weighted residual factors for significantly intense reflections | 0.083 |
| Weighted residual factors for all reflections included in the refinement | 0.0873 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.046 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4063633.html
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