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Information card for entry 4063853
Preview
| Coordinates | 4063853.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H40 Cl2 Zr |
|---|---|
| Calculated formula | C32 H40 Cl2 Zr |
| SMILES | [c]123[c]4([Zr]356789%10%11([c]1([c]8([c]4%10CC[c]15[c]36c(c(c(c([c]3%11[c]7([c]91C)C)C)C)C)C)C)C)(Cl)Cl)c(c(c(c2C)C)C)C |
| Title of publication | Synthesis, Characterization, and Polymerization Studies of Ethylenebis(hexamethylindenyl) Complexes of Zirconium and Hafnium |
| Authors of publication | Ransom, Paul; Ashley, Andrew E.; Brown, N. David; Thompson, Amber L.; O’Hare, Dermot |
| Journal of publication | Organometallics |
| Year of publication | 2011 |
| Journal volume | 30 |
| Journal issue | 4 |
| Pages of publication | 800 |
| a | 25.475 ± 0.0005 Å |
| b | 8.232 ± 0.0002 Å |
| c | 16.448 ± 0.0004 Å |
| α | 90° |
| β | 129.525 ± 0.001° |
| γ | 90° |
| Cell volume | 2660.61 ± 0.11 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0665 |
| Residual factor for significantly intense reflections | 0.0408 |
| Weighted residual factors for all reflections | 0.0949 |
| Weighted residual factors for significantly intense reflections | 0.0863 |
| Weighted residual factors for all reflections included in the refinement | 0.0949 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4063853.html
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Users of the data should acknowledge the original authors of the
structural data.