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Information card for entry 4064196
Preview
| Coordinates | 4064196.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C41 H61 Cl Ir P |
|---|---|
| Calculated formula | C41 H61 Cl Ir P |
| SMILES | [Ir]123([P](c4ccccc4c4c(cc(cc4C(C)C)C(C)C)C(C)C)(C4CCCCC4)C4CCCCC4)([CH]4=[CH]1CC[CH]3=[CH]2CC4)Cl |
| Title of publication | Steric and Electronic Parameters Characterizing Bulky and Electron-Rich Dialkylbiarylphosphines |
| Authors of publication | Diebolt, Olivier; Fortman, George C.; Clavier, Hervé; Slawin, Alexandra M. Z.; Escudero-Adán, Eduardo C.; Benet-Buchholz, Jordi; Nolan, Steven P. |
| Journal of publication | Organometallics |
| Year of publication | 2011 |
| Journal volume | 30 |
| Journal issue | 6 |
| Pages of publication | 1668 |
| a | 18.787 ± 0.002 Å |
| b | 9.3296 ± 0.0011 Å |
| c | 22.156 ± 0.003 Å |
| α | 90° |
| β | 108.885 ± 0.004° |
| γ | 90° |
| Cell volume | 3674.4 ± 0.8 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.087 |
| Residual factor for significantly intense reflections | 0.0707 |
| Weighted residual factors for significantly intense reflections | 0.1608 |
| Weighted residual factors for all reflections included in the refinement | 0.1681 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.115 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4064196.html
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